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Influence of spurious resonances on the interaction force in dynamic AFM

  • Luca Costa and
  • Mario S. Rodrigues

Beilstein J. Nanotechnol. 2015, 6, 420–427, doi:10.3762/bjnano.6.42

Graphical Abstract
  • ; amplitude modulation; atomic force microscopy; fluid borne excitation; interferometric detection; laser-beam detection; spurious resonances; Introduction Dynamic atomic force microscopy (AFM) was introduced in the late 1980s [1] as the natural evolution of the first atomic force microscopes [2]. Thanks to
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Published 10 Feb 2015
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